D2103
Abstract: MIL-PRF81705D DS-1131 PET FILM ASTM D2103
Text: STATSHIELD M/O SERIES Specifications: Electrical Properties Surface Resistance: Outer Surface Aluminum Layer Inner Surface Typical Values Test Procedures/Method <108 ohms <102 ohms <1011 ohms EOS/ESD S11.11 EOS/ESD S11.11 EOS/ESD S11.11 EOS/ESD S11.31 Modified Incline Plane
|
Original
|
PDF
|
MIL-PRF-81705D,
EOS/ESD-DS11
ESD-DS11
D2103
MIL-PRF81705D
DS-1131
PET FILM
ASTM D2103
|
ASTM-F-150
Abstract: fashion garment ASTMF-150 EIA-625 ESD-ADV53 esd 20.20 MIL-HDBK-263A
Text: TECHNICAL BULLETIN TB-3014 Surface Resistance Test Kit Operation and Maintenance Made in America • • • • • Footwear - ESD S9.1 - Footwear Resistive Characterization Garments - ESD STM2.1 Garments Seating - ESD STM12.1- Seating Resistive Measurement
|
Original
|
PDF
|
TB-3014
STM12
STM97
ESD-ADV53
TB-3014
ASTM-F-150
fashion garment
ASTMF-150
EIA-625
esd 20.20
MIL-HDBK-263A
|
SI02-07
Abstract: No abstract text available
Text: SI02-07 Surging Ideas TVS Diode Application Note PROTECTION PRODUCTS IEC 61000-4-2 ESD Review and Test Setup electronic or electrical product that can be conceived. The IEC 61000-4-2 ESD test setup is diagrammed in Figure 1. The standard requires air and contact
|
Original
|
PDF
|
SI02-07
SI02-07
|
Untitled
Abstract: No abstract text available
Text: SI02-07 Surging Ideas TVS Diode Application Note PROTECTION PRODUCTS IEC 61000-4-2 ESD Review and Test Setup electronic or electrical product that can be conceived. The IEC 61000-4-2 ESD test setup is diagrammed in Figure 1. The standard requires air and contact
|
Original
|
PDF
|
SI02-07
|
maxim rs232 multiplexer
Abstract: MAX1490 MAX483E MAX318 MAX3237E MAX681 ej-40
Text: INTERFACE CIRCUITS Application Note 639: Oct 03, 2000 Maxim Leads the Way in ESD Protection This application note describes how ESD threatens electronic systems, type of damage inflicted, how ESD is generated, test methods and waveforms used, human body and machine models for testing, IEC
|
Original
|
PDF
|
RS-485
com/an639
maxim rs232 multiplexer
MAX1490
MAX483E
MAX318
MAX3237E
MAX681
ej-40
|
3.3V TVS diode
Abstract: AOZ8304 AOZ8304DIL DFN-10 24kV
Text: AOZ8304 Low Capacitance 3.3V TVS Diode Array General Description Features The AOZ8304 is a transient voltage suppressor array designed to protect high speed data lines from ESD and lightning. ● ESD protection for high-speed data lines: – IEC 61000-4-2, level 4 ESD immunity test
|
Original
|
PDF
|
AOZ8304
AOZ8304
5/50ns)
3.3V TVS diode
AOZ8304DIL
DFN-10
24kV
|
AOZ8304
Abstract: 3.3V TVS diode AOS date code System
Text: AOZ8304 Low Capacitance 3.3V TVS Diode Array General Description Features The AOZ8304 is a transient voltage suppressor array designed to protect high speed data lines from ESD and lightning. ● ESD protection for high-speed data lines: – IEC 61000-4-2, level 4 ESD immunity test
|
Original
|
PDF
|
AOZ8304
AOZ8304
DFN-10
3.3V TVS diode
AOS date code System
|
Untitled
Abstract: No abstract text available
Text: AOZ8304 Low Capacitance 3.3V TVS Diode Array General Description Features The AOZ8304 is a transient voltage suppressor array designed to protect high speed data lines from ESD and lightning. ● ESD protection for high-speed data lines: – IEC 61000-4-2, level 4 ESD immunity test
|
Original
|
PDF
|
AOZ8304
AOZ8304
5/50ns)
|
ASTM-F-150
Abstract: No abstract text available
Text: TECHNICAL BULLETIN TB-3014 Surface Resistance Test Kit Operation and Maintenance Made in the United States ofAmerica • • Floors - ANSI/ESD S7.1- Resistive Characterization of Materials Floor Materials Footwear - ESD S9.2 - Footwear Resistive Characterization
|
Original
|
PDF
|
TB-3014
STM12
STM97
ESD-ADV53
TB-3014
ASTM-F-150
|
D882
Abstract: ASTM 1249
Text: STATFREE ESD ULTRA CLEAR BAG Low Charging Polyethylene Zipper Specifications: Zipper Color is ESD Yellow Electrical Properties Surface Resisitance: both surfaces @ 50%RH Charge Generation: Teflon Quartz Typical Value Test Procedures/Method <10E11 ohms
|
Original
|
PDF
|
10E11
STM11
0889mm)
MIL-STD-3010,
D882
ASTM 1249
|
MIL-D-3464
Abstract: D1876 MIL-D3464 MILD-3464 MIL-D-3464 type 2 D1876-93 MIL-D-3464 type 1 MIL-STD-3010 D-1876 FTMS-101C
Text: STATSHIELD STANDARD MOISTURE BARRIER BAG Specifications: Electrical Properties Typical Values Test Procedures/Method Surface Resistance both surfaces @ 12%RH ANSI/ESD STM11.11 <10E11ohms Static Shielding ANSI/ESD STM11.31 <10 nJ Static Shielding EIA 541
|
Original
|
PDF
|
STM11
10E11ohms
0889mm)
MIL-STD-3010,
D1876-93
02g/100sq
in/24hours
MIL-I-8835.
MIL-D-3464
D1876
MIL-D3464
MILD-3464
MIL-D-3464 type 2
D1876-93
MIL-D-3464 type 1
MIL-STD-3010
D-1876
FTMS-101C
|
ASTM-F-150
Abstract: fashion garment ASTMF-150 3014 LED 1X10E12 3014 LEDs ESD-ADV53 50560 led liquid level meter circuit diagram TB3014
Text: TECHNICAL BULLETIN TB-3014 Surface Resistance Test Kit Operation and Maintenance Made in the United States ofAmerica • • Floors - ANSI/ESD S7.1- Resistive Characterization of Materials Floor Materials Footwear - ESD S9.2 - Footwear Resistive Characterization
|
Original
|
PDF
|
TB-3014
STM12
STM97
ESD-ADV53
TB-3014
ASTM-F-150
fashion garment
ASTMF-150
3014 LED
1X10E12
3014 LEDs
50560
led liquid level meter circuit diagram
TB3014
|
13878
Abstract: No abstract text available
Text: STATFREE ESD ULTRA CLEAR BAG Specifications: Electrical Properties Surface Resisitance: Interior and Exterior Charge Generation: Teflon Quartz Typical Value Test Procedures/Method < 1 x 1011 ohms Per ANSI/ESD STM11.11 -0.10 (nC/in2) +0.10 (nC/in2)
|
Original
|
PDF
|
STM11
0889mm)
MIL-STD-3010,
2011/65/EU
1907/2006/CE.
13878
|
ASTM D2103
Abstract: ASTM F1249 ESD S11.11 ESD-DS11 PET FILM ASTM D2103 - 10
Text: Low Charging Polyethylene Zipper STATSHIELD M/O SERIES Specifications: Electrical Properties Surface Resistance: Outer Surface Aluminum Layer Inner Surface Typical Values Test Procedures/Method <108 ohms <102 ohms <1011 ohms EOS/ESD S11.11 EOS/ESD S11.11
|
Original
|
PDF
|
MIL-PRF-81705D,
EOS/ESD-DS11
ESD-DS11
ASTM D2103
ASTM F1249
ESD S11.11
PET FILM
ASTM D2103 - 10
|
|
|
oz800
Abstract: SOT-143 MARKING 550 AOZ8001JI sot143 TOP marking AOZ8001A SOT143-4L
Text: AOZ8001J Ultra-Low Capacitance TVS Diode Array General Description Features The AOZ8001J is a transient voltage suppressor array designed to protect high speed data lines from ESD and lightning. ● – IEC 61000-4-2, level 4 ESD immunity test e d en mm
|
Original
|
PDF
|
AOZ8001J
AOZ8001J
oz800
SOT-143 MARKING 550
AOZ8001JI
sot143 TOP marking
AOZ8001A
SOT143-4L
|
Untitled
Abstract: No abstract text available
Text: AOZ8001J Ultra-Low Capacitance TVS Diode Array General Description Features The AOZ8001J is a transient voltage suppressor array designed to protect high speed data lines from ESD and lightning. ● – IEC 61000-4-2, level 4 ESD immunity test – ±15kV (air discharge) and ±8kV (contact discharge)
|
Original
|
PDF
|
AOZ8001J
AOZ8001J
|
20 kV generator schematic
Abstract: 42665 V i Curve Tracer sony kv 42665 1 specifications curve tracer pin configuration of kv 24 Curve Tracer diagram curve tracer specifications curve tracer
Text: AND8363/D AMIS-42665 CAN Transceiver Immunity Against ESD Prepared by: ON Semiconductor http://onsemi.com APPLICATION NOTE Introduction • Termination 2 x 60 W, tap to Vsplit, Vsplit decoupled The AMIS-42665 high-speed CAN transceiver was ESD stressed without voltage supply and used a test PCB in four
|
Original
|
PDF
|
AND8363/D
AMIS-42665
AMIS-42665
20 kV generator schematic
42665
V i Curve Tracer
sony kv
42665 1
specifications curve tracer
pin configuration of kv 24
Curve Tracer diagram
curve tracer specifications
curve tracer
|
Untitled
Abstract: No abstract text available
Text: AOZ8001K Ultra-Low Capacitance TVS Diode Array General Description Features The AOZ8001K is a transient voltage suppressor array designed to protect high speed data lines from ESD and lightning. ● – IEC 61000-4-2, level 4 ESD immunity test – ±15kV (air discharge) and ±8kV (contact discharge)
|
Original
|
PDF
|
AOZ8001K
AOZ8001K
|
AOZ8001K
Abstract: AOZ8001KI AOZ8001KIL SC-89
Text: AOZ8001K Ultra-Low Capacitance TVS Diode Array General Description Features The AOZ8001K is a transient voltage suppressor array designed to protect high speed data lines from ESD and lightning. ● – IEC 61000-4-2, level 4 ESD immunity test – ±15kV (air discharge) and ±8kV (contact discharge)
|
Original
|
PDF
|
AOZ8001K
AOZ8001K
AOZ8001KI
AOZ8001KIL
SC-89
|
Untitled
Abstract: No abstract text available
Text: AOZ8304A Low Capacitance 3.3 V TVS Diode General Description Features ESD protection for high-speed data lines: – IEC 61000-4-2, level 4 ESD immunity test – ±30 kV (air discharge) and ±30 kV (contact discharge) – IEC 61000-4-4 (EFT) 40 A (5/50 ns)
|
Original
|
PDF
|
AOZ8304A
AOZ8304A
|
Untitled
Abstract: No abstract text available
Text: PCB Mount / Wet HA710 Series PRODUCT DESCRIPTIONS The HA710 series contains mercury and is thus suitable for ESD test circuits. With no chattering/bounce during operation, the HA710 is able to meet the specifications for ESD wave analysis and wave analysis equipment. The HA710 series has coil voltage options of
|
Original
|
PDF
|
HA710
HA710-118
1060hpa
2000Hz
HA710-118â
AWG22
|
Untitled
Abstract: No abstract text available
Text: AOZ8804A Ultra-Low Capacitance TVS Diode General Description Features ESD protection for high-speed data lines: – IEC 61000-4-2, level 4 ESD immunity test – Air discharge: ±15kV; contact discharge: ±15kV – IEC61000-4-4 (EFT) 40A (5/50nS) – IEC61000-4-5 (Lightning) 2.5A (8/20µS)
|
Original
|
PDF
|
AOZ8804A
IEC61000-4-4
5/50nS)
IEC61000-4-5
AOZ8804A
|
keytek MZ15
Abstract: No abstract text available
Text: ESD PROTECTION IN THE NINETIES I/O PORT DESIGNERS LOOK TO PROTECT AGAINST ESD THREATS B y Jo n Schleisner, Senior Applications Engineer rise time on the order of 10kv/ns recording these events requires sophisticated (and expensive) test equipment. In this case, the test pulse was applied
|
OCR Scan
|
PDF
|
|
Untitled
Abstract: No abstract text available
Text: s r ; Mta SI97-01 Note TEL: 805-498-2111 F A X : 805-498-3804 Electrostatic Discharge ESD Protection for Ethernet Transceivers This application note illustrates how to implement ESD protection for Ethernet transceivers. The protection technique shown may be used to aid in meeting the test
|
OCR Scan
|
PDF
|
SI97-01
OT-23
|
